用於執行全內反射散射量測的裝置與方法/ DEVICE AND METHOD FOR PERFORMING TOTAL INTERNAL REFLECTION SCATTERING MEASUREMENTS

專利類型

發明

專利國別 (專利申請國家)

中華民國

專利申請案號

111112390

專利證號

I 798041

專利獲證名稱

用於執行全內反射散射量測的裝置與方法/ DEVICE AND METHOD FOR PERFORMING TOTAL INTERNAL REFLECTION SCATTERING MEASUREMENTS

專利所屬機關 (申請機關)

中原大學

獲證日期

2023/04/01

技術說明

本揭示內容是關於用於對樣本玻片執行一全內反射散射(total internal reflection scattering，TIRS)量測的裝置及方法。前述裝置包含具有第一開口的第一反射板；具有第二及第三開口，且設置在該第一反射板上方的第二反射板，從而在兩者之間形成用於容置樣本玻片的狹縫，其中第一反射板的第一開口設置在第二反射板的第二開口的正下方；光源，其設置由第二反射板之第三開口所形成的空間中，並設以對該狹縫發射光；以及第一遮光層，設置在第三開口的上方從而覆蓋該光源並防止發射光洩漏。當該樣本玻片插入狹縫中，光源照明該樣本玻片以對該樣本玻片達成全內反射散射量測。 Disclosed herein are device and method for performing a total internal reflection scattering (TIRS) measurement to a sample slide. The device comprises a first reflective plate having a first opening; a second reflective plate having second and third openings and disposed on top of the first reflective plate thereby forming a slot therebetween for accommodating the sample slide, wherein the first opening of the first reflective plate is disposed directly underneath the second opening of the second reflective plate; a white light source disposed in the space formed by the third opening of the second reflective plate and configured to emit a white light into the slot; and a first blackout layer disposed on top of the third opening thereby covering the white light source and keeping the emitted white light from leaking. When the sample slide is inserted into the slot, the white light source illuminates the sample slide so as to achieve the TIRS measurement to the sample slide.

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