不均勻光場之自動光學檢測比對方法及其系統

專利類型

發明

專利國別 (專利申請國家)

中華民國

專利申請案號

100114347

專利證號

I 444911

專利獲證名稱

不均勻光場之自動光學檢測比對方法及其系統

專利所屬機關 (申請機關)

逢甲大學

獲證日期

2014/07/11

技術說明

本發明係有關一種不均勻光場之自動光學檢測比對方法及其系統，其方法部份包括下列步驟：一．準備步驟、二．最遠點及最近點之設定步驟、三．初始灰階分劃步驟、四．上下閥值計算步驟、五．建立LUT表步驟與六．影像比對步驟。藉前述步驟，以一影像擷取裝置，分別對一待測物體位在一平板上距離影像擷取裝置最近與最遠位置拍攝，而得到兩個目標影像，分別計算最近與最遠兩個目標影像之像素個數及其第一顏色平均之灰階值，將兩個灰階值分別設為上、下限閥值。再拍攝待測物體位於平板上之實際座標時的目標影像，先找出其中心座標之灰階值，進而以上、下限閥值找出目標影像之第一顏色像素個數的上、下閥值。重覆進行兩次，找出對應實際座標之目標影像其餘兩種顏色的上、下閥值；再分別填入一比對模組的六個LUT表，完成建立六個LUT表，而可以六個LUT表對影像進行檢測比對。故，本案兼具影像比對更精確、同時適用彩色及灰階影像、可克服影像反光與應用範圍廣泛等優點。 A novel positioning model of a double-CCD cameras calibration system, with an Alternate-Eight-Matrix (AEM) Look-Up-Table (LUT), was proposed. Two CCD cameras were fixed on both sides of a large scale screen to redeem Field Of View (FOV) problems. The first to the fourth AEMLUT were used to compute the corresponding positions of intermediate blocks on the screen captured by the right side camera. In these AEMLUT for the right side camera, the coordinate mapping data of the target in a specific space were stored in two matrixes, while the gray level threshold values of different position were stored in the others. Similarly, the fifth to the eighth AEMLUT were used to compute the corresponding positions of intermediate blocks on the screen captured by the left side camera. Experimental results showed that the problems of dead angles and non-uniform light fields were solved. In addition, rapid and precision positioning results can be obtained by the proposed method.

備註

本部(收文號1070041206)同意該校107年6月20逢產字第1070016142號函申請終止維護專利

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