HEAVY METAL DETECTING DEVICE AND THE FABRICATING METHOD THEREOF

專利類型

發明

專利國別 (專利申請國家)

美國

專利申請案號

15/483,441

專利證號

US 9,891,204

專利獲證名稱

HEAVY METAL DETECTING DEVICE AND THE FABRICATING METHOD THEREOF

專利所屬機關 (申請機關)

國立清華大學

獲證日期

2018/02/13

技術說明

本發明係關於一種重金屬檢驗試片與其製備方法，更明確地說，係關於一種能夠在採樣現場快速進行檢測的一種重金屬檢驗試片與其製備方法。 本發明提供一種重金屬檢驗試片與其製備方法，重金屬檢驗試片包含有一基材以及一奈米金屬粒子陣列。而重金屬檢驗試片製備方法包含以下步驟：準備一基材，並以一第一液體清洗以及使用一第一氣體乾燥該基材；將基材浸泡在一第一溶液中；浸泡一第一時間後，取出基材並以第一液體與第一氣體清洗乾燥；將基材浸泡在含有預先合成的一奈米金屬粒子水溶液中；以及浸泡一第二時間後，取出基材並以一第二液體與第一氣體清洗乾燥。相較於習知技術，本發明所提供重金屬檢驗試片在檢測方式上具有簡單又快速的優點。 The present invention provides a heavy metal detecting device and the fabricating method thereof. The heavy metal detecting device comprises a substrate and a nano-metal-particle array. The fabricating method of the heavy metal detecting device comprises following steps of: preparing a substrate, cleaning the substrate with a first liquid, and drying the substrate with a first gas; soaking the substrate in a first solution; after soaking the substrate for a first time period, cleaning and drying the substrate with the first liquid and the first gas respectively; soaking the substrate in a pre-mixture nano-metal-particle solution; and after soaking the substrate for a second time period, cleaning and drying the substrate with a second liquid and the first gas respectively. Compared to the prior arts, the heavy metal detecting device of the present invention has the advantage of simple and fast examination.

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