用於三維X光斷層掃描裝置的可調式夾具結構ADJUSTABLE FIXTURE STRUCTURE FOR 3-DIMENSIONAL X-RAY COMPUTED TOMOGRAPHY

專利類型

發明

專利國別 (專利申請國家)

美國

專利申請案號

14/106,867

專利證號

US 9,194,822 B2

專利獲證名稱

用於三維X光斷層掃描裝置的可調式夾具結構ADJUSTABLE FIXTURE STRUCTURE FOR 3-DIMENSIONAL X-RAY COMPUTED TOMOGRAPHY

專利所屬機關 (申請機關)

元智大學

獲證日期

2015/11/24

技術說明

有鑒於先前技術存在用於三維X光斷層掃描裝置上夾具調整檢測件位置不便所造成之檢測效率不彰，調整檢測件位置進一步造成檢測件損壞而影響檢測結果的問題。本發明遂揭露一種用於三維X光斷層掃描裝置的可調式夾具結構，將檢測件固定於可調式夾具結構的夾具件上，再透過調整連接件相對於調整滑槽滑動且由夾具件相對於夾具滑槽滑動，以使得檢測件藉由調整連接件以及夾具件調整至三維X光斷層掃描裝置的檢測範圍中，藉此可以達成提供用於三維X光斷層掃描裝置上夾具，便於調整檢測件位置且不易造成檢測件損壞的技術功效。 An adjustable fixture structure for 3-dimensional X-ray computed tomography is provided. A detection object (or specimen) is fixed on a fixture component of an adjustable fixture structure. The detection object is adjustable to the position at a detection range of a 3-dimensional X-ray computed tomography through an adjustment connection component of the adjustable fixture structure, which can be slid into an adjustment chute and the fixture component of the adjustable fixture structure, which can be slid into a fixture chute. Therefore, the efficiency of adjusting the detection object which is fixed on the fixture component for 3-dimensional X-ray computed tomography conveniently may be achieved and less damage in the detection object will be created upon adjusting.

備註

連絡單位 (專責單位/部門名稱)

產學合作組

連絡電話

(03)4638800#2286

網址