用於校正雷射量測裝置的方法及其系統METHOD AND SYSTEM FOR CALIBRATING LASER MEASURING APPARATUS

專利類型

發明

專利國別 (專利申請國家)

中華民國

專利申請案號

102148014

專利證號

I 489082

專利獲證名稱

用於校正雷射量測裝置的方法及其系統METHOD AND SYSTEM FOR CALIBRATING LASER MEASURING APPARATUS

專利所屬機關 (申請機關)

國立臺灣科技大學

獲證日期

2015/06/21

技術說明

一種雷射量測裝置的校正方法，適於校正包括雷射投光單元以及影像擷取單元的雷射量測裝置，包括下列步驟。提供包括至少一狹縫以及多個特徵點的校正板。調整校正板與雷射投光單元的相對位置，使雷射投光單元所投射的雷射光得以通過狹縫。利用影像擷取單元拍攝校正板，以產生校正板影像。將校正板影像進行處理，以取得分別對應於各所述特徵點於相機座標系的相機座標。之後，根據各所述特徵點的相機座標以及各所述特徵點於真實座標系的真實座標，計算多個校正參數，據以取得雷射量測裝置所產生的量測物影像中的量測物於真實座標系的真實座標。 A method for calibrating a laser measuring apparatus having a laser illumination unit and an image capture unit includes the following steps. A calibration board having at least one slit gap and a plurality of markers is provided. The relative position between the calibration board and the laser illumination unit is adjusted to allow a slit laser beam emitted by the laser illumination unit to pass through the at least one slit. The calibration board is captured by the image capture unit to generate a calibration board image. The calibration board image is processed so as to obtain the camera coordinate of each of the markers. A plurality of calibration parameters are calculated according to the camera coordinate and the actual coordinate of each of the markers so as to obtain the actual coordinates of an object captured in an object image produced by the laser measuring apparatus.

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