AUTOMATIC PROBE CONSTRUCTION SYSTEM AND METHOD THEREOF

專利類型

發明

專利國別 (專利申請國家)

美國

專利申請案號

15/016,120

專利證號

US 9,898,257 B2

專利獲證名稱

AUTOMATIC PROBE CONSTRUCTION SYSTEM AND METHOD THEREOF

專利所屬機關 (申請機關)

國立交通大學

獲證日期

2018/02/20

技術說明

一種自動化探針建構系統及其方法，該系統包括資料提取分析模組、探針篩選模組與探針驗證模組。該資料提取分析模組係依據複數指標提取電子裝置之複數目標資料及建構複數候選探針。該探針篩選模組係依據該些候選探針與可執行映像檔之指令碼建構一控制流程圖，以透過該控制流程圖自該些候選探針中篩選出至少一專用探針。該探針驗證模組係自該可執行映像檔中找出對應於該專用探針之指令碼以驗證該專用探針。藉此，本發明可自動建構專用探針並限縮該專用探針之數量。 This invention applies data structure inference and execution flow inference to discover practical kernel probes to data-of-interest. System state inspection is one of the most desired feature for various security purposes and nearly all related techniques originate from research facilities in USA according to our research. Thereby, the importance and impact are well-received in the US market. However, most of the previous research do not simultaneously cope with the two main challenges, which are data structure inference and execution flow inference, to automatically construct kernel probes. The application could suffer from lesser competition.

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