METHOD FOR IDENTIFYING STIMULATION TARGET

專利類型

發明

專利國別 (專利申請國家)

德國

專利申請案號

102013205592.7

專利證號

102013205592

專利獲證名稱

METHOD FOR IDENTIFYING STIMULATION TARGET

專利所屬機關 (申請機關)

國立交通大學

獲證日期

2022/11/10

技術說明

本發明結合MER (microelectrode recording) 及EIT (electrical impedance tomography) 技術提出一種在深層腦電刺激手術中將電極植入腦部精確位置的方法及裝置。本發明使用一複合式探針，至少包含一個MER感測器和多個微電極。當探針以MER訊號為導引植入刺激目標附近之後，依序驅動各個電極並收集電壓分佈資訊，再以EIT技術描繪出探針週圍的腦組織結構。根據描繪之腦組織結構圖可決定電極應植入之精確位置和植入軌跡，之後再將複合式探針取出並將深層腦電刺激之電極植入選定位置。 This invention proposes a method and device to implant the deep brain stimulation (DBS) lead into precise location within stimulation target using both microelectrode recording (MER) and electrical impedance tomography (EIT) techniques. We use a hybrid probe which contains at least a MER sensor and multiple microelectrodes. After the hybrid probe is placed in the proximity of the stimulation target guided by MER signals, microelectrodes take turns to be turn on and record electrical potentials. Next, the brain tissue nearby the probe can be profiled using EIT technique. According to the EIT profile, the precise stimulation target and corresponding implant trajectory can be found. Then, the permanent DBS lead is implanted into the selected location to replace the hybrid probe.

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