量測裝置及量測方法

專利類型

發明

專利國別 (專利申請國家)

中華民國

專利申請案號

103116601

專利證號

I 539137

專利獲證名稱

量測裝置及量測方法

專利所屬機關 (申請機關)

國立中興大學

獲證日期

2016/06/21

技術說明

本發明是一種量測裝置包含一光學單元、一位置偵測器，及一運算單元，該光學單元發射連續的雷射光束至一待測物體的表面並產生複數反射光，該位置偵測器用以接收該等反射光且包括一第一、第二電極，每一反射光分別在該第一、第二電極形成一第一、第二電流，該運算單元電連接該位置偵測器以接收每一第一、第二電流，且將該第一、第二電流分別進行相減、相加來產生一減法信號，及一加法信號，該運算單元根據該等減法信號與該等加法信號進行運算來得到該待測物體的表面的曲率，其中該曲率與該減法信號成正比，且與該加法信號成反比。 The present invention is a measuring apparatus comprising an optical unit, a position detector, and an arithmetic unit, the optical unit emitting a continuous laser beam to the surface of an object to be measured and generating a plurality of reflected light, the position detection Used to receive such reflected light and comprises a first and second electrodes, respectively, in each of the reflected light of the first and second electrodes form a first, a second current, the position calculating unit electrically connected to the detector to receive each of the first and second current, and the first and second currents are subtracted, the addition to produce a subtraction signal, and an adder signal, the arithmetic unit in accordance with such subtraction signal with such an addition signal operation to obtain the curvature of the surface of the object to be measured, wherein the curvature is proportional to the subtraction signal, and inversely proportional to the sum signal.

備註

本部(收文號1090073280)同意該院109年12月8日興產字第1094300651號函申請終止維護專利(中興)

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