偵測元件的測量方法

專利類型

發明

專利國別 (專利申請國家)

中華民國

專利申請案號

109121623

專利證號

I 736336

專利獲證名稱

偵測元件的測量方法

專利所屬機關 (申請機關)

國立臺灣大學

獲證日期

2021/08/11

技術說明

本專利在電壓端加入脈衝訊號於暗箱中測量未照光前電流-電壓曲線圖，再使用不同波長的近、中紅外光雷射或是更加遠紅外光之光源照射元件測量照光後之電流-電壓曲線圖，進而比較照光前以及照光後電流數值計算出元件之響應值以及Fluctuation，可發現未加入脈衝式訊號量測出來之電流值有著較大數值之熱浮動，以至於在外加偏壓下計算出來的響應值不具有可靠性；而加入脈衝式訊號能有效降低電流之熱浮動，就能有效提升響應值之可靠性。 This patent adds pulse signal in voltage to measure the current-voltage curve before the illumination in the dark box, and then uses a wavelength infrared laser or a far-infrared light source to measure the current-voltage curve after illumination, and then compare the response value and fluctuation value of current before the illumination with after illumination. it can be found that the current value measured without the pulse signal has a large value of thermal fluctuation, so that the calculated response value is not reliable in added bias. However, it can be effectively reduced the thermal fluctuation of the current by external pulse signal, which also can effectively improve the reliability of the response value.

備註

連絡單位 (專責單位/部門名稱)

產學合作總中心

連絡電話

33669945

網址