同步色相相移轉換方法以及其三維形貌量測系統Method for simultaneous hue phase-shifting and system for 3-D surface profilometry using the same

專利類型

發明

專利國別 (專利申請國家)

美國

專利申請案號

12/512,713

專利證號

US 8,411,284 B2

專利獲證名稱

同步色相相移轉換方法以及其三維形貌量測系統Method for simultaneous hue phase-shifting and system for 3-D surface profilometry using the same

專利所屬機關 (申請機關)

國立臺北科技大學

獲證日期

2013/04/02

技術說明

本發明提供一種同步色相相移轉換方法以及其三維形貌量測方法與系統，其係利用彩色結構光，取得關於物體之色彩條紋影像，然後由該彩色條紋影像之色相飽和強度(HSI)模型中取得關於該彩色條紋影像之一色相(hue)資訊，最後再將該色相資訊轉換成一色相相位變化資訊。利用該色相相位變化資訊透過色相相位重建重建物體三維形貌。由於本發明之彩色結構光係由複數個具有空間上(spatial domain)相位差之色光所形成，因此單張之彩色取像包含多步相移後之相位封裝資訊而即可執行相移及相位重建，省略傳統相位封裝及尤拉轉換之過程，改善物體表面形貌重建(surface reconstruction)以及系統量測之效率。 The present invention provides a method for simultaneous hue phase-shifting and a system for 3-d surface profilometry using the foregoing method, wherein a single structured-light fringe pattern with encoded multiple trapezoidal color fringes is projected on an object so as to obtain a color image having deformed fringe patterns and then a hue information is extracted from a HSI color model associated with the fringe pattern and then the hue information is transformed into a hue phase-shift information for restructuring the 3-dimensional surface profile of the object. Since the color structured light is composed of a plurality of colorful light having phase shift with each other in spatial domain, the single structured-light pattern is capable of comprising multiple hue phase-shifting information so that the phase shifting and unwrapping is capable of being performed by one-shot 3-D surface reconstruction process.

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