光學干涉裝置

專利類型

發明

專利國別 (專利申請國家)

中華民國

專利申請案號

101151079

專利證號

I 448662

專利獲證名稱

光學干涉裝置

專利所屬機關 (申請機關)

國立中央大學

獲證日期

2014/08/11

技術說明

一種光學干涉裝置之一光源發出一光線。一極化分光元件將光線分光成一第一光線及一第二光線，第一光線及第二光線沿著一光纖元件傳輸而分別具有一第一光路及一第二光路，並被合光成一合光光線。一分光元件將合光光線分光成一第三光線及一第四光線。一相位調制元件對第三光線進行相位延遲。一第一偏極元件及一第二偏極元件對第三光線及第四光線分別進行偏極化。一第一偵測元件及一第二偵測元件分別對應偵測第三光線及第四光線，並分別產生一第一偏極訊號及一第二偏極訊號。一解調運算元件依據第一偏極訊號及第二偏極訊號產生一外差干涉訊號。 A light source of an optical interferometric apparatus emits a light. The light is splitted into a first light and a second light by a polarized beam splitter. The first light and the second light are transmitted along an optical fiber element and have a first optical path and a second optical path respectively and are combined into a combined light. The combined light is splitted into a third light and a fourth light by a beam splitter. The phase of the third light is retarded by a phase modulator. The third light and the fourth light are polarized by a first polarizer and a second polarizer respectively. A first sensing element and a second sensing element senses the third light and the fourth light and generates a first polarized signal and a second polarized signal respectively. A demodulation-calculation element generates a heterodyne interferometric signal according to the first polarized signal and the second polarized signal.

備註

本部(收文號1060048584)同意該校106年7月13日中大研字第1061430172號函申請終止維護專利

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