反射式管狀波導粒子電漿共振感測系統及其感測裝置REFLECTION-BASED TUBULAR WAVEGUIDE PARTICLE PLASMON RESONANCE SENSING SYSTEM AND SENSING DEVICE THEREOF

專利類型

發明

專利國別 (專利申請國家)

美國

專利申請案號

14/806,321

專利證號

US 9,612,197 B2

專利獲證名稱

反射式管狀波導粒子電漿共振感測系統及其感測裝置REFLECTION-BASED TUBULAR WAVEGUIDE PARTICLE PLASMON RESONANCE SENSING SYSTEM AND SENSING DEVICE THEREOF

專利所屬機關 (申請機關)

國立中正大學

獲證日期

2017/04/04

技術說明

本發明係揭露一種反射式管狀波導粒子電漿共振感測系統及其感測裝置，其中感測裝置包含具有管壁之中空之管狀波導元件、設置於管狀波導元件之管壁之一端點上之反射層以及分布於管壁之至少一壁面上之貴金屬奈米粒子層。其中，入射光從管狀波導元件之管壁之另一端點入射管壁並於管壁中產生多次全內反射，並經由反射層反射而再次於管壁中產生多次全內反射，再由入射之端點出射。當待測樣品經由開口接觸管狀波導元件時，貴金屬奈米粒子層上之辨識單元與待測分析物結合時，導致粒子電漿共振條件發生改變，而使得管壁中之入射光之訊號發生變化。 A reflection-based tubular waveguide particle plasmon resonance sensing system and a sensing device thereof are disclosed. The sensing device comprises a hollow tubular waveguide element having wall, a reflection layer disposed on one end of the wall (distal end), and a noble metal nanoparticle layer distributed on the surface of the wall. An incident light enters the wall through another end of the tubular waveguide element (proximal end) and being total internal reflected many times along the wall, then is reflected by the reflection layer and being total internal reflected many times along the wall again, and finally, the incident light exits the proximal end. Wherein, when the sample contacts the noble metal nanoparticle layer of the tubular waveguide element, particle plasmon resonance is induced and hence the signal intensity of the light exiting the tubular waveguide element changes.

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