樣品分離用晶片、樣品檢測裝置及樣品檢測方法

專利類型

發明

專利國別 (專利申請國家)

中華民國

專利申請案號

110108703

專利證號

I 807273

專利獲證名稱

樣品分離用晶片、樣品檢測裝置及樣品檢測方法

專利所屬機關 (申請機關)

國立清華大學

獲證日期

2023/07/01

技術說明

本發明是有關於一種晶片、檢測裝置與檢測方法，且特別是有關於一種樣品分離用晶片、樣品檢測裝置及利用表面增強拉曼光譜(surface-enhanced Raman spectrum)的樣品檢測方法。目前在進行疾病的病源體分析時，由於檢測流程複雜且檢測時間過長，因此常會延誤最佳治療時間。以細菌分離為例，傳統上是用離心、免疫抗體標靶、透析等方式做分離，但這些方法需要長時間等待及繁複技術來達到分離效果。【0003】 本發明提供一種樣品分離用晶片、樣品檢測裝置及利用表面增強拉曼光譜的樣品檢測方法，其有助於縮短樣品檢測流程與檢測時間。A chip for sample separation including a first substrate, a first electrode, a first dielectric layer, a second substrate, a second electrode, a second dielectric layer, and a flow channel layer is provided. The first electrode is disposed on the first substrate. The first dielectric layer is disposed on the first electrode and includes a first opening. The first opening exposes a portion of the first electrode. The second electrode is disposed on the second substrate. The second dielectric layer is disposed on the second electrode and includes a second opening. The second opening exposes a portion of the second electrode. An area of the first electrode exposed by the first opening is smaller than an area of the second electrode exposed by the second opening. The flow channel layer is sandwiched between the first dielectric layer and the second dielectric layer and includes a through hole. The through hole communicates between the first opening and the second opening.

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