Optical device and method for determining an optical property of specimen

專利類型

發明

專利國別 (專利申請國家)

美國

專利申請案號

14/844,536

專利證號

US 9,964,485 B2

專利獲證名稱

Optical device and method for determining an optical property of specimen

專利所屬機關 (申請機關)

國立成功大學

獲證日期

2018/05/08

技術說明

本發明提供一種用於判定一樣本之光學特性之漫反射光譜法系統及一種用於操作該系統之方法。該系統包括：一發光單元，其包含一發光終端，該發光單元經組態以發射光；一光學媒介，其配置於該裝置之一端，該光學媒介可控制以在多個光學狀態之間切換且經組態以經由在不同光學狀態中之該光學媒介將該光傳遞至該樣本，其中該光學媒介包含與該發光單元之該發光終端接觸的一第一表面及用於與該樣本接觸的一第二表面；及一偵測模組，其包含用於接收自該樣本散射之光的一或多個接收終端，以用於判定該樣本之該光學特性。 A diffuse reflectance spectroscopy system for determining optical properties of a specimen and a method for operating the same are provided. The system includes: a light emitting unit comprising a light emitting terminal, the light emitting unit configured to emit light; an optical medium arranged at one end of the device, the optical medium being controllable to switch between multiple optical states and configured to deliver the light to the specimen through the optical medium in different optical states, wherein the optical medium comprises a first surface in contact with the light emitting terminal of the light emitting unit and a second surface for contact with the specimen; and a detecting module comprising one or more receiving terminals for receiving light scattered from the specimen for determining the optical properties of the specimen.

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