零磁場居禮溫度的量測方法與電腦可讀取記錄媒體

專利類型

發明

專利國別 (專利申請國家)

中華民國

專利申請案號

110113030

專利證號

I 767650

專利獲證名稱

零磁場居禮溫度的量測方法與電腦可讀取記錄媒體

專利所屬機關 (申請機關)

國立清華大學

獲證日期

2022/06/11

技術說明

一種零磁場居禮溫度的量測方法與電腦可讀取記錄媒體。所述零磁場居禮溫度的量測方法包括先取得一樣品的線性熱膨脹係數訊號，並根據熱膨脹係數α對溫度的曲線中的熱膨脹係數之變化率決定二級相變化的起始溫度與結束溫度，再利用公式計算所述樣品的理論熱膨脹係數αT，以得到無磁性時樣品的熱膨脹係數對溫度的曲線。利用公式計算所述樣品的磁性熱膨脹係數αm，以得到樣品在上述起始溫度±預定溫度的溫度範圍內的磁性熱膨脹係數對溫度的曲線。利用公式計算所述樣品的磁化量X，以得到樣品於零磁場下磁化量X對溫度的曲線。利用公式計算所述樣品的磁化量衰退率ρ對溫度的曲線，在此曲線之斜率最大值對應的溫度點即零磁場下所述樣品的居禮溫度。 A zero magnetic field Curie temperature measuring method and a computer-readable recording medium are provided. The zero magnetic field Curie temperature measuring method includes first obtaining a linear coefficient of thermal expansion (CTE) signal of a sample for determining an initial temperature and an end temperature of second order phase transition according to the change rate of the thermal expansion coefficient in a curve of the thermal expansion coefficient α versus temperature, and then calculating a theoretical CTE αT of the sample with a formula to obtain a curve of the CTE of the sample versus temperature when the sample is under non-magnetic condition. A magnetic CTE αm of the sample is calculated with a formula to obtain a curve of the magnetic CTE of the sample versus temperature within the temperature range of above-mentioned initial temperature ± a predetermined temperature. A magnetization X of the sample is calculated with a formula to obtain a curve of the magnetization X of the sample versus temperature under zero magnetic field. A curve of a magnetization decay rate ρ of the sample versus temperature is calculated with a formula, wherein the temperature point corresponding to the maximum slope of the curve is Curie temperature of the sample under zero magnetic field.

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