激發波段可調式之時域聚焦多光子激發螢光顯微鏡系統及其激發光選擇模組

專利類型

發明

專利國別 (專利申請國家)

中華民國

專利申請案號

106116835

專利證號

I 655455

專利獲證名稱

激發波段可調式之時域聚焦多光子激發螢光顯微鏡系統及其激發光選擇模組

專利所屬機關 (申請機關)

國立中央大學

獲證日期

2019/04/01

技術說明

此激發波長可調之時域聚焦多光子激發螢光顯微術可實現於每種螢光分子之最佳雙光子激發條件下，觀測具多種不同螢光分子標記之樣品的光學切片影像。此發明中提出之光學裝置可以對於不同中心波長的超快脈衝光源，但維持其相同照射位置與繞射角度，以達成快速可調波長激發。其當波長掃描範圍由770到920 nm時，其軸向限制激發的寬度為3.0±0.7 um，時域聚焦平面的偏移距離小於0.95 um。於多種不同螢光分子量測時，藉由即時對不同螢光分子以波長掃描激發方式得到較佳螢光訊號，此系統可提供時域聚焦多光子激發螢光顯微成像影像品質的一種改善方式。 An excitation wavelength tunable temporal focusing multiphoton excitation microscopy (TFMPEM) is performed to visualize the optical section images of the multiple-fluorospheres labeled specimens via the maximum two-photon excitation (TPE) of each kind of fluorophores. The proposed optical setups can have same illumined position and diffraction angle at a diffraction grating for the different central wavelengths of the ultrafast pulse light source to achieve the fast tunable wavelength excitation. The width of the axially confined excitation was 3.0±0.7 um and a shifting distance of the temporal focal plane was less than 0.95 um during the wavelength scanning range from 770 to 920 nm. Furthermore, the proposed system provides an approach to improve a quality of the TFMPEM images by the scanning wavelength excitation for the different fluorospheres to obtain the better fluorescent signals in the multiple-fluorospheres measurements.

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智權技轉組

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03-4227151轉27076

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