玻璃基板量測方法及其裝置

專利類型

發明

專利國別 (專利申請國家)

中華民國

專利申請案號

098141679

專利證號

I 393852

專利獲證名稱

玻璃基板量測方法及其裝置

專利所屬機關 (申請機關)

國立雲林科技大學

獲證日期

2013/04/21

技術說明

一種玻璃基板量測方法及其裝置，準備一量測裝置，該量測裝置設有一夾具、一影像擷取組及一影像處理組，該夾具設有一具有磁鐵的而與一壓板及一擋板相配合，而該影像處理組係設有一影像量測軟體，透過壓板及檔板與基座相貼合，使玻璃基板的一側邊緣或一端部外露於基座外，該影像擷取組擷取玻璃基板的側邊及端部影像，將所擷取的影像傳送至影像處理組中進行處理，使灰階影像轉換為二元的數位影像，並透過最小平方法求出該玻璃基板邊緣的線性迴歸線與玻璃基板端部的尺寸與角度，藉以構成一方便量測、準確度高且節省成本的量測方法及其裝置者。 The measuring method and device for parameter measurements of a glass substrate have been developed. The measurement device contains a fixture, an image acquisition module and an image processing module. In the fixture there is a base in which magnets, the platen and the baffle are installed. The image processing module includes an image measurement system software. By mounting the base with the platen and the baffle, one side of the glass substrate appears at the edge or end of the base. The single-sided and end image will be acquired by the image acquisition module and then analyzed by the images processing module where the gray-scale image is converted to binary digital images and by the regression of least squares method the approximate linear equation, dimensions and angles of the glass substrate end can be revealed. With the system, a convenient, high accuracy and cost-effective measurement method and fixture has been realized.

備註

本部(發文號1090003147)同意貴校108年9月26日雲科大研字第1080502640號函申請終止維護專利。

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