一種檢測液晶面板之裝置及其方法

專利類型

發明

專利國別 (專利申請國家)

中華民國

專利申請案號

104139501

專利證號

I 588465

專利獲證名稱

一種檢測液晶面板之裝置及其方法

專利所屬機關 (申請機關)

國立臺灣師範大學

獲證日期

2017/06/21

技術說明

本發明液晶面板光學檢測方法提供一種液晶面板的全場振幅、相位與偏振調制的時間與空間量測方式，透過本方法的離軸式數位全像架構記錄經由液晶面板繞射之物體光波與參考光波所形成之數位全像干涉條紋，並重建出液晶面板之量化波前資訊而取得完整的振幅與相位調制特性。再者，透過控制雙光束參考光波的正交偏振，可分別記錄與重建具有正交偏振之振幅與相位資訊，並從中分析出其偏振調制特性。本方法所提離軸式數位全像架構，其全像擷取時間僅受限於影像感測器之曝光時間，因而， 搭配高速電腦處理架構不僅可進行即時全場檢測液晶面板的時間與空間光學調制特性, 且具產業線上現場快速檢測應用的可行性。 This invention was proposed a full field optical measuring method for characterizing the spatio-temporal amplitude, phase and polarization modulations for the liquid crystal (LC) panel. The object wave diffracted from the LC panel was used to generate the holographic interference fringe with the reference wave, and the digital hologram was recorded by the off-axis digital holographic architecture in this method. The quantitative wavefronts information on the LC panel can be reconstructed from digital hologram, and which can obtain the complete amplitude and phase modulations. In the proposed optical measurement method based on digital holographic architecture, the measurement speed is only limited by the exposure conditions of the image sensor. Therefore, the proposed method can be applied to measure the spatio-temporal wavefronts modulations of LC panel in situ with real-time processing.

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