決定物件特徵之影像處理裝置及其方法

專利類型

發明

專利國別 (專利申請國家)

中華民國

專利申請案號

098112907

專利證號

I 424373

專利獲證名稱

決定物件特徵之影像處理裝置及其方法

專利所屬機關 (申請機關)

國立彰化師範大學

獲證日期

2014/01/21

技術說明

本發明係應用陣列感測元件之幾何關係與其數值解算方法，量測被偵測物位置及估測偵測裝置參數(如姿態及位置等)之研究，主要目的為降低執行量測目標物時人員、物質可能發生之危險性，適用於無法以實際及現有方法量測目標物之環境(如行駛中之車輛量測車道幾何、敵方目標物之量測等)，並增加量測效率。利用偵測裝置陣列感測元件產生之影像(或感測訊號)幾何關係與數值解算方法，估測被偵測物位置、偵測及校正裝置參數(如姿態及位置等)等。 Measured objects are sometimes in unsafe locations. In addition, the parameters of the measuring equipments including their attitudes and positions are usually difficult to be assessed. This patent is proposed to solve these kind of problems by the micro sensing cell array. It can measure the positions of objects and to calculate the parameters of the measuring equipments by the numberic algorithm from a image/images created by the sensing array. The geometry of the sensing cells of the measuring quipment such as CCD, IRCCD, radar, LIDAR, and other optical devices is utilized to solve some equations about the positions of the objects and the parameters of the measuring equipment. It will protect the engineers from the dangerous environment as they measure, measure the positions of the objects which cannot be measured by traditional approach, and raise the efficiency of the measurement.

備註

本部(收文號1090001816)同意該校109年1月3日研發字第1080400547號函申請終止維護專利(彰師大)

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