大量客製化產品的品質預測方法Product quality prediction method for mass customization

專利類型

發明

專利國別 (專利申請國家)

中華民國

專利申請案號

105144278

專利證號

I 614699

專利獲證名稱

大量客製化產品的品質預測方法Product quality prediction method for mass customization

專利所屬機關 (申請機關)

國立成功大學

獲證日期

2018/02/11

技術說明

工業4.0的核心價值與目標之一在於整合製造與迎合使用者的需求，以便能增進產品、系統和服務能力，進而能滿足少量多樣的客製化生產環境。因此，工業4.0要求須能將傳統大量生產的製造技術轉為大量客製化（MC）的生產技術。以鋁輪圈加工自動化（WMA）為例，為滿足MC之預期，製造商將致力於提供種類多但成本低與交貨週期短且需高品質的鋁輪圈產品。因此，合乎大量客製化（MC）要求的WMA產線，需要具備能滿足少量多樣的客製化生產環境之能力，使其能快速且精準地用於製造不同種類之鋁輪圈產品。本計畫應用全自動虛擬量測 (AVM)系統並整合新發展之目標值調校機制（TVA）以滿足WMA於MC的生產要求。TVA機制旨在增強AVM能適應客製化之能力以完善全自動化與迅速地完成MC生產的目標。 One of the core values of Industry 4.0 targets to integrate people’s demand into manufacturing for enhanced products, systems, and services for a wider variety of increasingly personalized customization of products. Thus, Industry 4.0 advances the traditional manufacturing techniques from mass production towards mass customization (MC). Take wheel machining automation (WMA) as an example, to meet MC expectations, manufacturers should offer customized wheels at a large scale with low cost, short lead-time, and high quality. Thus, WMA cells with MC capability are requested to be designed to have high degree of quick responsiveness to accurately react in case of machining-condition changes for manufacturing different wheel types. To meet the requirements of MC production, this paper proposes to apply the Automatic Virtual Metrology (AVM) system together with the so-called Target-Value-Adjustment (TVA) scheme. The AVM system was developed by the authors to convert sampling inspections with metrology delay into real-time and on-line total inspection; while the TVA scheme is designed to enhance AVM’s adaptive customization capability for automatically and rapidly accomplishing the goals of MC production.

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