基於導電高分子之導電率變化的自由基測量方法

專利類型

發明

專利國別 (專利申請國家)

中華民國

專利申請案號

103132566

專利證號

I 518317

專利獲證名稱

基於導電高分子之導電率變化的自由基測量方法

專利所屬機關 (申請機關)

國立清華大學

獲證日期

2016/01/21

技術說明

一種自由基測量方法，包括：提供一感測器，其包含一基材及一導電高分子層，導電高分子層設置於基材上以及導電高分子層之材料為一導電高分子；施加具有自由基之一液體樣本至感測器，以使液體樣本至少覆蓋導電高分子層，從而自由基氧化該導電高分子並降低導電高分子層之導電度；以及計算液體樣本之自由基濃度，其係基於導電高分子層在施加液體樣本前後之一導電度變化率。本發明具有的優勢包括：低成本、小尺寸及容易操作，這使得它成為偵測羥基自由基作為氧化壓力研究的良好選項。 A method for measuring free radical comprises providing a sensor including a substrate and a conductive polymer layer, wherein the conductive polymer layer is configured on the substrate and made of conductive polymer; applying a liquid sample with free radical to the sensor so that the conductive polymer layer is in contact with the liquid sample and the conductivity of the conductive polymer layer is lowered due to oxidation of the conductive polymer by free radical; and calculating the concentration of the free radical in the liquid sample based on the conductivity change rate of the conductive polymer before and after the liquid sample is applied to the the conductive polymer. The present invention has advantages including low cost, small size, and ease of operation, which make it a good candidate for detecting hydroxyl radicals for oxidative stress studies.

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