應用像散法於透明體與半透明體厚度檢測之系統

專利類型

發明

專利國別 (專利申請國家)

中華民國

專利申請案號

096105486

專利證號

I318681

專利獲證名稱

應用像散法於透明體與半透明體厚度檢測之系統

專利所屬機關 (申請機關)

國立虎尾科技大學

獲證日期

2009/12/21

技術說明

應用像散法於透明體與半透明體厚度檢測之系統，係以雷射光源產生一準直光束，並經過反射鏡反射入射於聚焦物鏡與圓柱遠鏡後聚焦在四象限感測器間，當透明或半透明體之待測物置放於聚焦物鏡與圓柱透鏡間，會產生像散，利用光點位置量測方式，可將待測物調整與光軸垂直，當光軸穿透待測物後的光束入射至四象感測器，最後經由四象感測器接收電壓訊號並再由S 曲線線性方程式，將電壓轉換成失焦位移訊號，再將失焦位移訊號代入幾何光學公式，最後求得待測玻璃厚度。 Application of the astigmatic method to the transparent and a translucent thickness detection of the system, use the laser diode to produce a beam of collimation light, through pass the mirror and incident the focusing reflector lens and the cylindrical lens on the quadrant detector. When the transparent or translucent object placed between the cylindrical lens focusing lens will produce the astigmatic image. Using the light position measurement method, can be adjusted with the vertical axis, after the light penetration the object , incident to the quadrant detector . Finally, received by the quadrant detector voltage signal, by the S-curve of linear equations, the voltage into a focus-error-signal, then let focus-error-signal incorporated into the geometric optics formula, and finally obtained the thickness of the glass under test.

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