使用空間光調變器的超解析率廣視野光切片顯微鏡

專利類型

發明

專利國別 (專利申請國家)

日本

專利申請案號

特願 2009-126888

專利證號

特許 5085608

專利獲證名稱

使用空間光調變器的超解析率廣視野光切片顯微鏡

專利所屬機關 (申請機關)

中央研究院

獲證日期

2012/09/14

技術說明

本發明為一種具有結構式照明之光切片顯微系統和方 法。光源產生一個具有空間圖樣的一個光束，以便在複數個相位的每個相位上連續照明一個樣本。偵測器在第一個縱向解析率和第一個橫向解析率上，偵測樣本之第一套影像，每個影像與照明之複數個相位的個別相位相關。處理器處理第一套影像以產生強化的切片影像樣本。處理器在第二個縱向解析率上，產生代表第二套影像的數據；隨後進行頻譜分析，藉以在第二個橫向解析率上，形成代表樣本之強化切片影像數據。 Systems and methods for optical sectioning microscopy with structured illumination are provided. A light source generates a light beam with a spatial pattern for successively illuminating a sample at each phase of a plurality of phases. A detector detects a first set of images of the sample at a first axial resolution and a first lateral resolution, each image being associated with a respective phase of the plurality of phases of the illumination. A processor processes the first set of images to generate an enhanced sectioned image of the sample. More specifically, the processor generates data representing a second set of images at a second axial resolution greater than the first axial resolution; and subsequently, performs spectral analysis on the data representing the second set of images to form data representing the enhanced sectioned image of the sample at a second lateral resolution greater than the first lateral resolution.

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