高頻晶片天線量測平台HIGH-FREQUENCY CHIP ANTENNA MEASUREMENT SYSTEM

專利類型

發明

專利國別 (專利申請國家)

美國

專利申請案號

13/757,279

專利證號

US 8,884,830 B2

專利獲證名稱

高頻晶片天線量測平台HIGH-FREQUENCY CHIP ANTENNA MEASUREMENT SYSTEM

專利所屬機關 (申請機關)

國立中正大學

獲證日期

2014/11/11

技術說明

本創作提出一種可量測任意輻射場型晶片天線之遠場量測系統平台。使用探針激發晶片天線。步進馬達帶動半圓形拱臂，並以待測晶片天線為圓心，繞晶片天線來進行垂直平面上的變換角度的量測。可拆式探針載台可隨晶片天線饋入埠的位置而改變方向，已達成量測平面的切換。半圓形拱臂可旋轉至水平面並固定之，來源天線可在半圓形拱臂上滑動，進行水平面上的量測。來源天線亦可固定在半圓形拱臂上任意位置，繞晶片天線等距旋轉，進行三維空間量測。 Description of Invention (please type or print clearly): This invention proposed a far-field pattern measurement system which is suitable for the chip antennas with all kinds of pattern profile. The signal feeding is through the on-wafer probing. The stepper motor drives the semicircle arch arm to rotate around the chip antenna for vertical scan. The probe holder can be repositioned to change both feeding direction of chip antenna and the measuring plane. While the semicircle arch is fixed in the horizontal plane, the source horn can be moved along the arch arm for horizontal scan. At the completion of each vertical scan, the source horn is replaced to the next angular position, which can perform the 3-D far-field measurement in the shape of a sphere.

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