金屬奈米顆粒流體自動線上取樣裝置與技術 APPARATUS FOR ON-LINE SAMPLING OF METAL NANOPARTICLE FLUID AND TECHNIQUE OF THE SAME

專利類型

發明

專利國別 (專利申請國家)

美國

專利申請案號

10/771,425

專利證號

US 7,501,095 B2

專利獲證名稱

金屬奈米顆粒流體自動線上取樣裝置與技術 APPARATUS FOR ON-LINE SAMPLING OF METAL NANOPARTICLE FLUID AND TECHNIQUE OF THE SAME

專利所屬機關 (申請機關)

國立臺北科技大學

獲證日期

2009/03/10

技術說明

本發明係為一種真空潛弧製程之金屬奈米顆粒流體自動線上取樣裝置與技術，主要目的在於線上即時擷取具備製程特性之奈米顆粒懸浮液樣品，提供精確之金屬顆粒特性(如顆粒大小、均勻度及生成速率等)，使取樣出之奈米顆粒懸浮液具有其線上之加工機制特性，以利進行奈米流體製程設計之製程參數最佳化與顆粒品質監控。由於金屬奈米流體真空潛弧製程乃在低溫(3~5 C)及負壓(小於30 Torr)特殊情況下進行，本創作以自製之懸浮液取樣器及收集器，整合於此真空潛弧金屬奈米顆粒流體之生成設備中，利用真空泵與真空腔之壓力差原理，以及樣品輸送路徑之恆溫設計，使樣品經真空開關閥及電腦控制，精確地由真空腔流向真空泵，進而流入收集器中由粒徑分析儀進行數據分析。本創作將可有效避免停機擷取樣品之不便與離線量測之誤差，同時避免奈米懸浮液因上述之延誤而產生沈澱現象，確保樣品量測結果之準確性。 This patent presents one kind of apparatus and technique for automatic on-line sampling of metal nanoparticle suspension, which is prepared by the arc spray nanoparticle synthesis system. The preparation process is operating under a vacuum condition (around 30 Torr) with an operating temperature of 3~5 C. Two critical steps were devised in the developed on-line sampling system to extract the metal nanoparticle suspension from the vacuum chamber into the sample-collecting container. These are the utilization of pressure differences between the vacuum chamber and the sampling container, to be applied as the extracting force and the constant temperature control of liquid sample along its transferring path for preventing the sample from possible vaporization due to liquid phase transformation. In addition, the system was designed to obtain on-line sampling accuracy and efficiency.

備註

本部(收文號1060040584)同意該校106年6月19日北科大產學字第1067900147號函申請終止維護專利

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