磁場探針及其探針頭

專利類型

發明

專利國別 (專利申請國家)

中華民國

專利申請案號

102107876

專利證號

I 487916

專利獲證名稱

磁場探針及其探針頭

專利所屬機關 (申請機關)

國立臺灣大學

獲證日期

2015/06/11

技術說明

一種磁場探針及其探針頭在此揭露。探針頭包含內金屬層、屏蔽元件、濾波元件。內金屬層用以接收待測磁場。屏蔽元件用以屏蔽內金屬層，包含第一屏蔽金屬層以及第二屏蔽金屬層。第一屏蔽金屬層位於內金屬層上方，且第二屏蔽金屬層位於內金屬層下方。濾波元件用以濾除干擾內金屬層之電場，包含第一濾波金屬層以及第二濾波金屬層。第一濾波金屬層介於第一屏蔽金屬層與內金屬層之間，且第二濾波金屬層介於第二屏蔽金屬層與內金屬層之間。 A magnetic field probe and a probe head thereof are disclosed herein. The probe head includes an internal metallic layer, a shielding unit and a filtering unit. The internal metallic layer receives a magnetic field to be measured. The shielding unit shields the internal metallic layer, including a first shielding metallic layer and a second shielding metallic layer. The first and the second shielding metallic layer are respectively stacked above and below the internal metallic layer. The filtering unit filters out an electric field interfering with the internal metallic layer, including a first filtering metallic layer and a second filtering metallic layer. The first filtering metallic layer is stacked between the first shielding metallic layer and the internal metallic layer. The second filtering metallic layer is stacked between the second shielding metallic layer and the internal metallic layer.

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