解析透鏡組

專利類型

發明

專利國別 (專利申請國家)

中華民國

專利申請案號

101120871

專利證號

I 449960

專利獲證名稱

解析透鏡組

專利所屬機關 (申請機關)

國立臺灣大學

獲證日期

2014/08/21

技術說明

一種解析透鏡組，其包含第一透鏡及第二透鏡。第一透鏡係由數個均為平面之第一金屬層與第一介電層交錯堆疊而形成一半球體或半圓柱體。第二透鏡係由數個均為曲面之第二金屬層與第二介電層交錯堆疊而形成一具有凹槽之半球體或半圓柱體，且凹槽容量有第一透鏡。其中，第一透鏡用以投射待解析物體之波長訊號(高階訊號)至第二透鏡，使第二透鏡放大該波長訊號。藉此，解析透鏡組可突破光的繞射極限，以解析小於半波長之微結構的資訊。 The assembly of lenses for resolution is demonstrated. It consists of a first lens and a second lens. Among them, the shape of first lens is a hemi-spherical and a hemi-cylinder shape alternately stacked, which are structured a planar surface of first metal layers and first dielectric layers periodically. The second lens is a hemi-spherical and a hemi-cylinder with cavity stacked alternately, which are from a curved surface second metal layers and second dielectric layers periodically. Truly, the first lens is used for projecting wavelength signals ( with high-spatial-frequency) of a resolution object to the second lens, and then the second lens enhances the wavelength signals. Follow the results, the assembly of lens for resolution not only can overcome the light diffraction limit, but also resolute the half sub-wavelength information though this device.

備註

本部(收文號1100033534)同意該校110年6月9日校研發字第1100036312號函申請終止維護專利(台大)

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