應用於5G智慧製造設備的天線信號均優化方法

專利類型

發明

專利國別 (專利申請國家)

中華民國

專利申請案號

110115233

專利證號

I 745259

專利獲證名稱

應用於5G智慧製造設備的天線信號均優化方法

專利所屬機關 (申請機關)

國立虎尾科技大學

獲證日期

2021/11/01

技術說明

【中文】 一種應用於5G智慧製造設備的天線信號均優化方法，包含：即時接收智慧製造設備每一天線的訊號並擷取通道容量，及訊號參數；提供XY分佈圖，X軸定 義為通道容量，Y軸定義為訊號參數，並於XY分佈圖做出通過通道容量平均值並垂直於X軸的目標線；將所有天線的通道容量對應於X軸，所有天線的訊號參 數對應於Y軸，標記點於XY分佈圖，依據標記點於XY分佈圖擬合出回歸方程式; 依據回歸方程式建立修正方程式，修正方程式為回歸方程式的平行方程式，且每一標記點對應一修正方程式，將目標線之值帶入修正方程式後以得到修正後之回歸值訊號參數。 【英文】 A method for optimizing antenna signal is applicable for 5G smart manufacturing device and includes the steps of: receiving a signal of each antenna of a smart manufacturing device in real time, and capturing a channel capacity and a signal parameter thereof; providing an X-Y scatter diagram, wherein an X axis is defined as the channel capacity, and a Y axis is defined as the signal parameter, and drawing an objective line passing through an average value of the channel capacity and vertical to the X axis in the X-Y scatter diagram; corresponding the channel capacity of each antenna to the X axis, and corresponding the signal parameter of each antenna to the Y axis to form a label dot on the X-Y scatter diagram, and fitting a regression equation on the X-Y scatter diagram based on all label dots; forming a corrected equation based on the regression equation, the corrected equation being parallel to the regression equation, and one of the label dots passing through the corrected equation, and bringing the value corresponding to the objective line into the corrected equation to obtain a corrected regression signal parameter.

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