量化材料未知應力與殘餘應力之裝置及其方法APPARATUS FOR QUANTIFYING UNKNOWN STRESS AND RESIDUAL STRESS OF A MATERIAL AND METHOD THEREOF

專利類型

發明

專利國別 (專利申請國家)

美國

專利申請案號

13/622,358

專利證號

US 8,780,348 B2

專利獲證名稱

量化材料未知應力與殘餘應力之裝置及其方法APPARATUS FOR QUANTIFYING UNKNOWN STRESS AND RESIDUAL STRESS OF A MATERIAL AND METHOD THEREOF

專利所屬機關 (申請機關)

國立清華大學

獲證日期

2014/07/15

技術說明

一種量化材料未知應力與殘餘應力之裝置，係用以量化一待測物之未知應力與殘餘應力，該裝置包括：一光源、一偏光鏡、一第一四分之一波片、一標準試片、一第二四分之一波片、一檢光鏡、一施載單元、一光譜儀及一檢測模組；該光源係用以產生多波長或單波長之光；該偏光鏡係設置於該光源前方，且其一面係面對該光源以使光產生偏振；該第一四分之一波片係設置於該偏光鏡前方，且其一面係面對該光源以使光產生圓偏振；本發明亦揭露二量化材料未知應力與殘餘應力之方法。 An apparatus for quantifying unknown stress and residual stress of a material comprises a light source, a polarizer, a first quarter-wave plate, a standard material, a second quarter-wave plate, an analyzer, a loading unit, a spectrometer and a detecting module. The light source generates lights having multiple-wavelengths or single-wavelength. The polarizer is mounted in front of the light source and converting a beam of light into a beam with vertical polarization. The first quarter-wave plate is mounted in front of the polarizer and converting a beam of light into a beam with circular polarization. Two methods for quantifying unknown stress and residual stress of a material are disclosed.

備註

連絡單位 (專責單位/部門名稱)

智財技轉組

連絡電話

03-5715131-62219

網址