大氣游離裝置及熱重分析質譜系統

專利類型

發明

專利國別 (專利申請國家)

中華民國

專利申請案號

103132157

專利證號

I 512782

專利獲證名稱

大氣游離裝置及熱重分析質譜系統

專利所屬機關 (申請機關)

國立中山大學

獲證日期

2015/12/11

技術說明

本發明提供一種大氣游離裝置,其包含:一電噴灑單元,用以產生一第 一帶電粒子;一氣體腔室,具有一氣體通道用以容置並流通一氣體,該電噴 灑單元係設置於該氣體通道中;一第一電極部,設置於該電噴灑單元外側;以 及一第二電極部,設置於該氣體腔室的外側,其中該第一電極部與該第二電 極部通電後形成一電場,將該氣體轉變成一第二帶電粒子,與該第一帶電粒 子混合形成一複合游離源。再者,本發明另提供一種熱重分析質譜系統,其 包含如上述之大氣游離裝置;一熱重分析裝置;以及一質譜分析裝置。 An ambient ionization device is provided, and has: an electrospray unit for generating a first charged particle, a gas chamber having a gas channel with the electrospray unit disposed therein and a gas passed therethrough, a first electrode portion disposed outside of the electrospray unit, and a second electrode portion disposed outside of the gas chamber. An electronic field is formed after the first and the second electrode portion are energized to convert the gas into a second charged particle. The second charged particle is mixed with the first charged particle to form an integrated ionization source. Furthermore, a system of thermogravimetry integrated with mass spectrometer is also provided, and comprises the abovementioned ambient ionization device, a thermogravimetric device, and a mass spectrometric device.

備註

連絡單位 (專責單位/部門名稱)

產學營運及推廣教育處

連絡電話

(07)525-2000#2651

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