落射頂錐殼層光超解析系統及顯微鏡

專利類型

發明

專利國別 (專利申請國家)

大陸

專利申請案號

201910175590.4

專利證號

4972169

專利獲證名稱

落射頂錐殼層光超解析系統及顯微鏡

專利所屬機關 (申請機關)

國立清華大學

獲證日期

2022/03/04

技術說明

本發明揭露一種可在三維空間高速成像的光學系統，以及利用該系統來快速截取三維腦神經結構之光學影像，此高速三維成像的光學系統包含：一光源、一分光鏡、一光束整型器、至少一透鏡與影像偵測模組，其中光束整型器將光源入射於透鏡的光束焦點沿光路方向拉近或延伸，如此一來即可將光源所輻射之光於透鏡後聚焦在樣本內的不同深度。其中光源、樣品分別置於透鏡兩側；影像偵測模組，配置於光路徑上，俾使樣品處被激發出的光訊號至少透過一透鏡被該影像偵測模組接收，以利擷取該樣品之不同深度平面影像。 The present invention discloses an optical system for detecting a sample include a light source, one beam shaper, at least one lens, an image detecting module wherein the light source, one beam shaper, at least one lens are sequentially configured along a light path, wherein one beam shaper moves the focus of the light along the light path back or forth so the light focused on the sample by the light source through one lens is focused onto different depths inside the sample, wherein the light source and the sample are placed at both sides of at least one lens. The image detecting module is configured on a light path, and the sample is placed between at least one lens and the image detecting module and to capture plane images of different depth within the sample.

備註

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