具不對稱粒子形狀之定域化表面電漿共振檢測系統

專利類型

發明

專利國別 (專利申請國家)

中華民國

專利申請案號

102119085

專利證號

I 498540

專利獲證名稱

具不對稱粒子形狀之定域化表面電漿共振檢測系統

專利所屬機關 (申請機關)

國立成功大學

獲證日期

2015/09/01

技術說明

定域化表面電漿共振已被廣泛應用於折射率感測。許多研究利用品質因素(figure of merit)來評估感測器的性能，品質因素定義為靈敏度與頻譜半高寬的比值。根據品質因素的定義，相同靈敏度之下頻寬愈窄的樣品，預期有更好的性能。本團隊提出一種縮減表面電漿共振頻寬的新技術，此發明使用橢偏術量測兩垂直偏振光之間的相位差。由於表面電漿共振產生的相位躍遷現象，橢偏儀所測得的頻譜有一極窄的高峰。經由橢偏術測得的頻譜半高寬遠比量測穿透率或反射率得到的半高寬來得窄，因此品質因素大幅提高。此發明預期能提高折射率感測器的性能。 Localized surface plasmon resonance (LSPR) has been applied for refractive index sensing. The quality of sensing performance is estimated by figure of merit (FOM), which is defined as ratio between sensitivity and full width at half maximum. According to the definition, a setup with smaller bandwidth is expected to possess higher performance. We propose a new method to reduce bandwidth of LSPR sensing. The optical setup of ellipsometry is adopted to measure the phase difference between two perpendicular polarizations. Because of phase transition phenomenon of LSPR, the phase spectrum exhibits a narrow peak. The bandwidth of phase spectrum is much narrower than intensity spectrum, which results in a higher FOM. In conclusion, a better performance of refractive index sensing is expected to use this technology.

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本部(收文號1080026227)同意該校108年4月26日成大研總字第1081103516號函申請終止維護專利

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