基於時間域相位展開之應力分析方法

專利類型

發明

專利國別 (專利申請國家)

中華民國

專利申請案號

105123152

專利證號

I 628422

專利獲證名稱

基於時間域相位展開之應力分析方法

專利所屬機關 (申請機關)

國立清華大學

獲證日期

2018/07/01

技術說明

一種應力分析方法，適於一計算機裝置執行，包含以下步驟：步驟(A)存取一光譜資料，該光譜資料是由一光學檢測系統透過光彈技術偵測一待測物件的一干涉條紋圖形所產生，該光譜資料包含至少三筆對應於相異波長的光強度資訊；步驟(B)依據每一光強度資訊計算一相應的包裹相位資訊；步驟(C)依據每一包裹相位資訊計算一相應的包裹應力資訊，每一包裹應力資訊是正比於其相應的包裹相位資訊對波長之線性函數的乘積；步驟(D)依據包裹應力資訊之間的相對關係擇定一計算關係式；及步驟(E)依據該計算關係式計算一相應於該待測物件之包裹應力資訊的應力值。 A stress analysis method based on temporal phase unwrapping is to be implemented by a computer device, and includes: (A) receiving spectrum data which is generated from an interference pattern of an object by an optical inspection system through photoelastic technique, and has at least three light intensity information with respect to different wavelengths; (B) calculating a wrapped phase information based on each of the light intensity information; (C) calculating a wrapped stress information, which is proportional to a product result of each of the wrapped phase information and a linear function of each of the wavelengths, based on each of the wrapped phase information; (D) selecting a calculation relation based on the relation between the wrapped stress information; and (E) calculating a stress value with respect to the wrapped stress information through the calculation relation.

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