光學量測裝置

專利類型

新型

專利國別 (專利申請國家)

中華民國

專利申請案號

105204350

專利證號

M 524456

專利獲證名稱

光學量測裝置

專利所屬機關 (申請機關)

國立清華大學

獲證日期

2016/06/21

技術說明

本創作係一種光學量測裝置，其包括：用以各自產生不同單一波長之第一能量的至少二來源元件，且該第一能量形成第一能量路徑，該二來源元件係供彼此更換以提供不同單一波長之該第一能量；對應於產生該第一能量之該來源元件且用以承載樣品，以使該樣品之至少一部分位於該第一能量路徑中的承載元件；以及對應於該樣品且用以偵測經過該樣品之該第一能量或偵測由該樣品受該第一能量激發所產生之第二能量的能量偵測元件。本創作係具有低成本、小體積及低機構複雜性的優點。 This utility model is an optical measuring device, comprising: at least two source units generate a first energy with different single wavelength, respectively, and the first energy forms a first energy path, and the two source units are replaced with each other to provide the first energy with different single wavelength; a carrier unit is corresponding to the source unit generating the first energy and is used for carrying a sample to make at least one part of the sample being positioned at the first energy path; and an energy detecting unit is corresponding to the sample and is used for detecting the first energy through the sample or detecting a second energy generated by the exiting from the first energy. This utility model has advantages with low cost, small volume and low mechanism complexity.

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