發光二極體之晶片溫度量測系統及量測方法

專利類型

發明

專利國別 (專利申請國家)

中華民國

專利申請案號

098137866

專利證號

I 393896

專利獲證名稱

發光二極體之晶片溫度量測系統及量測方法

專利所屬機關 (申請機關)

國立虎尾科技大學

獲證日期

2013/04/21

技術說明

主要針對各功率LED的晶片，為保持原完整封裝型態的LED，透過晶片溫度自動量測系統以外部加熱法，推算出LED在不同工作電流的晶片溫度，並應用電腦輔助設計技術模擬分析各工作電流和環境溫度對LED晶片溫度的影響。根據不同工作電流的LED進行溫度評估。應用LabVIEW（Laboratory Virtual Instrument Engineering Workbench, LabVIEW）研製LED晶片溫度自動量測系統，藉由量測LED的順向電壓與外部環境加熱溫度之關係建立特性曲線，依特性曲線來推算LED實際工作時的晶片溫度。藉由量測數據結合模擬資料，建構完善的晶片溫度分析系統。 In order to maintain the original integrity package of LED chips, which are with variety power, we calculate the temperature of LED at different operating current by automatic measurement system of LED chip temperature and the external heating method. Apply the computer assistant of design technology to simulate and analyze the impact of LED chip temperature for the operating current and ambient temperature.Measuring the actual hardware is to develop the automatic measurement system of LED chip temperature, which is the application of LabVIEW. The automatic measurement system of LED chip temperature estimate the temperature of LED chip by the characteristic curves, which is set up by the factors of LED forward voltage and heating temperature of the external environment.

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